The Łukasiewicz Research Network has decided to select using measurement instrumentation from Tektronix and Keithley to investigate the current and voltage characteristics of wide-bandgap semiconductors.
In a recent project, the Institute sought to develop a new generation of pioneering devices and materials based on wide-bandgap semiconductors such as GaN, SiC, Ga2O3 and others for power electronics, with particular applications in fast-charging stations for electric cars.
Ph.D. Eng. Andrzej Taube of the Łukasiewicz – Institute of Microelectronics and Photonics says: “We found the biggest challenge the project posed was meeting the stringent requirements for the functionality and flexibility of the system when measuring semiconductor devices, which were in the form of both on-wafer chips and TO-220 and TO-247 packages. “The project also required a variety of measurement procedures with some current measurements in the femto Amp range.”
Maria Heriz, Vice President EMEAI, Tektronix, commented: “At Tektronix, we are dedicated to supporting our customers throughout all their endeavors. We are delighted to have been able to provide the Lukasiewicz – Institute of Microelectronics and Photonics with not only high-quality equipment to match their requirements but also high-level technical advice to benefit their project and ensure innovative work can continue.”
In addition, the dynamic characterization of GaN power semiconductor devices presents specific challenges not encountered with other semiconductors. This involves a complex test setup to retrieve key figures such as dynamic RDS (on) or the capacitance value between the terminals.
The customer also specified the need for automatic switching between high-voltage and high-current measurements without re-cabling which Tektronix equipment was able to provide.
The Łukasiewicz – IMiF chose devices from the 2600 Series of Source Meter Units (SMUs) to measure current-voltage characteristics in a wide range of voltages (up to 3kV) and current, extending from the femtoAmp range up to 50A.
This series of SMUs are designed specifically to characterize and test high voltage/current electronics and power semiconductors, such as diodes, FETs, and IGBTs, high brightness LEDs and DC-DC converters.
Moreover, 2600 Series Source Measure Units, along with an ATV HV switch and Tektronix MDO3034 digital oscilloscopes, will be used to meet the need for dynamic RDS (on) measurements of GaN power transistors.
Tektronix not only supplied equipment to the Institute but was also advised the researchers on effective measurement techniques.