Rohde & Schwarz has collaborated with IHP to perform the industry’s first full 2D/3D antenna characterization of transceiver modules operating in the D-Band. Rohde & Schwarz has also continued its pioneering sub-THz research efforts with a focus on this frequency range, reaching new milestones.
Wireless communications test expert Rohde & Schwarz and IHP GmbH (Innovations for High-Performance Microelectronics) have transferred this test method successfully into the sub-THz range: They demonstrated the first full 2D/3D over-the-air measurements of a radar module at D-Band frequencies.
Gerhard Kahmen, Managing Director of IHP, says: “Sub-THz frequency systems are getting more and more attention in research and many fields of application. The Rohde & Schwarz OTA test system, extended to D-Band, provides an excellent way to characterize radiation patterns of the complex antenna structures, realized in our D-Band radar chips, in a time-efficient and precise way. For IHP, these measurements are valuable to understand the physics of the antenna structures and to further improve their performance. The very successful cooperation with an industrial partner leading in the field of wireless and mmWave communication shows the benefit of close interaction between research and application.”
Alexander Pabst, Vice President of Systems & Projects at Rohde & Schwarz says: “We are excited to work with such an excellent partner as Innovations for High-Performance Microelectronics on advancing our industry-leading test solutions for over-the-air testing. These joint efforts will help researchers and key industry players to test and characterize antenna systems and transceiver modules for future automotive radar applications and wireless communication standard, that we eventually call 6G.”
The test setup consists of the R&S ATS1000 antenna test system, the R&S ZNA43 vector network analyzer and the R&S AMS32 antenna measurement software from Rohde & Schwarz. The R&S ATS1000 antenna test system is a compact and mobile shielded chamber solution for OTA and antenna measurements, ideal for 5G mmWave applications.
IHP provided four different devices under test (DUT), based on the same D-Band radar transceiver chipset but with different antenna structures, including on-chip single and stacked patches with air trenches and an on-chip antenna array. The over-the-air characterization verified the wider bandwidth provided by the stacked patches than that by the single patch.