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Rohde & Schwarz to Present its Test Solutions at Embedded World 2020

At the leading trade show for the embedded industry in Nuremberg, Rohde & Schwarz will highlight its T&M solutions for embedded designs in the automotive sector and high speed digital interfaces.

RohdeThe T&M expert will demonstrate trendsetting Bluetooth T&M solutions and innovative solutions for power, EMC and power integrity measurements.

The company is also celebrating ten years of Rohde & Schwarz oscilloscopes.

Rohde & Schwarz is exhibiting at embedded world 2020 in the Nuremberg Trade Show Center in Hall 4, Booth 4-218 from February 25 to 27, 2020. There, visitors can experience the following topics:

T&M solutions for automotive applications

Rohde & Schwarz will be demonstrating innovative test solutions for the automotive sector, including compliance tests for 100/1000 GBit/s automotive Ethernet on a high performance oscilloscope from the R&S RTP family. The tests specified by the TC9 working group will be demonstrated on anR&S ZNB vector network analyzer using a 1000Base-T1 connection. For developers of electric vehicles, the company is presenting a compact and flexible test solution for automotive battery management systems. The R&S NGM200 and R&S NGL200 series integrated power supplies deliver extremely stable output voltages with very low residual ripple and minimal noise, enabling simulation of a wide variety of battery types.

Test solutions for wireless and high speed digital interfaces

In the wireless sector, the R&S CMW platform of testers simplify testing of Bluetooth® Low Energy (LE) devices and wearables. Rohde & Schwarz has developed a variety of Bluetooth® LE test solutions that perform RF tests over the air interface without a control cable. These unique solutions enable quick preconformance tests over the air and in shielded chambers. They support the test mode for Bluetooth Classic and direct test mode (DTM) up to Rel. 5.1 for Bluetooth LE. Test solutions for various wireless interfaces and WLAN, including IEEE 802.11ac and 11ax, are also available.

The high performance oscilloscopes of the R&S RTP familywith measurement bandwidths up to 16 GHz are ideal for signal integrity tests on high speed digital interfaces. They are the only commercially available oscilloscopes with integrated time domain reflectometry (TDR) and time domain transmissometry (TDT) measurement functions and the only oscilloscopes with real-time deembedding, which allows the high precision trigger system to directly access the corrected signal without bandwidth limitation. Rohde & Schwarz will also be presenting its new jitter decomposition option that enables considerably more detailed signal integrity analysis than previously possible with oscilloscopes. These unique functions and all other relevant measurements and protocol analyses, such as DDR4, USB 3.1 and PCIe transmissions, will be demonstrated.

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Nitisha Dubey

I am a Journalist with a post graduate degree in Journalism & Mass Communication. I love reading non-fiction books, exploring different destinations and varieties of cuisines. Biographies and historical movies are few favourites.

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