RoodMicrotec Utilizes Jenoptik’s Solutions for Wafer Level Testing
Jenoptik has declared that the company has been chosen to provide an essential component for novel PIC wafer-level tests with the optoelectronic UFO Probe Card.
RoodMicrotec benefits from a fast and simple integration, high flexibility, and state-of-the-art test technology.
“As an innovative technology platform, the UFO Probe® Card offers the necessary flexibility and scalability. This enables test service providers like us to respond quickly and easily to new challenges in the market,” says Jan de Koning Gans, Managing Director of RoodMicrotec GmbH.
“We are pleased to have RoodMicrotec as a strong and experienced partner for test services, and as a supply chain specialist and service provider for the semiconductor industry, it also has access to a wide range of applications. It is important for Jenoptik to recognize the different needs of the end customers to promote relevant further developments at an early stage,” says Tobias Gnausch, Product Manager for the UFO Probe® Card in Jenoptik’s Light & Optics Division.
Wafer-level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established – for photonic integrated circuits (PICs), the test ecosystem is still under development.
In line with an increasing demand for photonic solutions in the semiconductor sector, the requirements for corresponding ecosystems for optoelectronic components are rising and thus, not only semiconductor manufacturers with their supply chain must change their thinking.
In addition to the existing test infrastructure for electrical components, also infrastructures for photonic component testing are required. Test houses offering services such as wafer-level testing for fabless manufacturers face the challenge of expanding or reimagining their test solutions towards photonic integrated circuits (PICs).
In addition to the established tests for ICs, RoodMicrotec now also offers test service for this new type of PIC testing at the wafer level to customers from the semiconductor industry.
Jenoptik provides the necessary technology platform with the UFO Probe® Card and thus supports RoodMicrotec in setting up the respective test structure.
The UFO Probe® Card from Jenoptik enables the testing of electrical and optical components with only one probe card – in parallel, not sequentially as with previous solutions. Thus, wafer-level tests can be performed in a more time-saving manner and the throughput is significantly increased.
As a Plug & Play solution, the hybrid probe card can be integrated directly and without much of an adaption effort into RoodMicrotec’s existing standard IC wafer probers.
