Tektronix has developed the new Keithley S530 Series Parametric Test System with KTE 7 software and other enhancements.
The S30 platform enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. This reduced overall cost of ownership profile helps manufacturers meet aggressive price pressures in competitive new markets.
“Analog and mixed-signal semiconductor manufacturers continue to experience strong demand from new end-user applications in 5G communications, automotive, IoT, medical, green energy, and other markets,” says Chris Bohn, vice president and general manager at Keithley/Tektronix. “This significant test platform update helps those customers bring new products to market more quickly and cost-effectively while giving them the ability to adapt to new requirements in the future.”
Innovations to the S530 Series maximize tester utilization over a wide product mix and easily migrate existing test software, probe cards and other items while offering full data correlation along with significant speed improvements. The S530-HV model enables testing up to 1100V on any pin to boost throughput by 50 percent or more over competitive systems in power and WBG applications. Chip manufacturers can test a wide mix of products with a single system, including automotive products per the IATF-16949 quality management standard. Calibration can be performed with minimal downtime in-house or through Tektronix’s service organization for worldwide, high-quality, personal support.
The KTE7-based platform offers semiconductor manufacturers the easiest and most cost-effective migration path from legacy S600 and S400 systems, preserving full data correlation along with throughput improvements up to 25 percent faster than the S600.
Tektronix Pioneers New S530 Series Parametric Test System.