Tektronix has introduced the new Keithley S530 Series Parametric Test System with new KTE 7 software support and other improvements presented.
The S530 platform enables semiconductor fabs to expand parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafer hourly efficiency.
“Analog and mixed-signal semiconductor manufacturers continue to see strong demand from new end-user applications in 5G communications, automotive, IoT, medical, green energy, and other markets,” said Chris Bohn, vice president and general manager, Keithley / Tektronix. “This significant overhaul of the test platform will help these customers bring new products to market faster and more cost-effectively while giving them the flexibility to adapt to new requirements in the future.”
To meet the testing requirements for these products, the KTE 7-based S530 platform offers laboratory-grade measurement performance with minimal set-up and testing time. Fast, fully flexible configurations up to 1100V are possible as new applications are added and requirements change. This enables chip makers to cost-effectively and efficiently expand into high-growth power and WBG device markets (including the automotive market) with minimal test/setup time, on a single system, and with minimal investment.
The S530 series innovations maximize test utilization across a wide range of products and allow easy migration of existing test software, probe cards, and other elements while providing full data correlation and significant speed improvements. The S530-HV model enables testing of up to 1100 V on each pin and thus offers a 50 percent or more increased throughput compared to competitor systems in the field of power and WBG applications.
The KTE7-based platform offers semiconductor manufacturers the easiest and most cost-effective migration path from older S600 and S400 systems, whereby the complete data correlation is retained and the throughput can be increased by up to 25 percent compared to the S600 platform.