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Tektronix to Showcase Innovative Test Solutions at Embedded World 2020

Tektronix has announced recently that the company will be showcasing a wide-range of test and measurement products at Embedded World 2020 (Stand 104, Hall 4), which takes place from 25-27 February in Nuremberg, Germany.

TektronixThe Tektronix products on display will address a wide range of applications.

Visitors to the Tektronix stand will be able to get hands-on demonstrations and learn how Tektronix products can solve their individual test and measurement challenges. From engineers – for engineers.

The Tektronix stand will feature demonstrations covering a wide range of application areas, including:

  • Embedded Design
  • Power Electronics
  • Automotive Solutions
  • Education & Advanced Research

Highlights on the Tektronix stand this year will include:

  • 3 & 4 Series Oscilloscopes – Two new oscilloscopes, the 3 Series MDO and the 4 Series MSO, engineered for a wide range of demanding applications at an affordable price, Tektronix’ new mid-range oscilloscopes have been reimagined with the award-winning user experience and industrial design first introduced in the 5 and 6 Series MSOs. Built from the engineer up, the 3 Series MDO and the 4 Series MSO round out Tektronix’ portfolio of oscilloscopes.
  • With a low-noise, in-house designed ASIC at its heart, Tektronix’s 6 Series MSO mixed signal oscilloscope advances the performance threshold of mid-range oscilloscopes to 8GHz and delivers a 25GS/s sample rate simultaneously on all 4 channels, allowing engineers working on faster, more complex embedded systems designs to accurately view up to four high-speed signals at one time. With usability and upgradeability at its forefront, coupled with advanced measurements capability and new probing technologies, the 6 Series MSO really delivers measurement confidence.
  • A new software plugin for its the AFG31000 Arbitrary/Function Generator that makes it possible to perform crucial double pulse testing in less than a minute, saving a significant amount of time when compared to alternative methods. With the new Double Pulse Test software, engineers can quickly define pulse parameters from a single window on the AFG31000’s large touchscreen display and then generate the pulses they need to perform testing – all in under a minute.

For more info, click here


Nitisha Dubey

I am a Journalist with a post graduate degree in Journalism & Mass Communication. I love reading non-fiction books, exploring different destinations and varieties of cuisines. Biographies and historical movies are few favourites.

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